| ATOMIC AND MOLECULAR PHYSICS |
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Ion Photon Emission Microscope for Single Event Effect Testing in CIAE |
| Yan-Wen Zhang, Gang Guo**, Jian-Cheng Liu, Shu-Ting Shi, Ying-Can Qin, Li-Li Li, Lin-Feng He |
Department of Nuclear Physics, China Institute of Atomic Energy, Beijing 102413
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| Cite this article: |
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Yan-Wen Zhang, Gang Guo, Jian-Cheng Liu et al 2017 Chin. Phys. Lett. 34 073401 |
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Abstract Ion photon emission microscopy (IPEM) is a new ion-induced emission microscopy. It employs a broad ion beam with high energy and low fluence rate impinging on a sample. The position of a single ion is detected by an optical system with objective lens, prism, microscope tube and charge coupled device (CCD). A thin ZnS film doped with Ag ions is used as a luminescent material. Generation efficiency and transmission efficiency of photons in the ZnS(Ag) film created by irradiated Cl ions are calculated. A single Cl ion optical microscopic image is observed by high quantum efficiency CCD. The resolution of a single Cl ion given in this IPEM system is 6 μm. Several factors influencing the resolution are discussed. A silicon diode is used to collect the electrical signals caused by the incident ions. Effective and accidental coincidence of optical images and electronic signals are illustrated. A two-dimensional map of single event effect is drawn out according to the data of effective coincidence.
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Received: 27 February 2017
Published: 23 June 2017
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| PACS: |
34.50.Bw
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(Energy loss and stopping power)
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34.50.Gb
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(Electronic excitation and ionization of molecules)
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79.20.Rf
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(Atomic, molecular, and ion beam impact and interactions with surfaces)
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| Fund: Supported by the National Natural Science Foundation of China under Grant No 11690044. |
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