| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Scanning-Position Error-Correction Algorithm in Dual-Wavelength Ptychographic Microscopy |
| Rui Ma1,2, Shu-Yuan Zhang1, Tian-Hao Ruan1, Ye Tao1, Hua-Ying Wang3, Yi-Shi Shi1,2** |
1School of Optoelectronics, University of Chinese Academy of Sciences, Beijing 100049
2Center for Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049
3College of Mathematics and Physics, Hebei University of Engineering, Handan 056038
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| Cite this article: |
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Rui Ma, Shu-Yuan Zhang, Tian-Hao Ruan et al 2020 Chin. Phys. Lett. 37 044201 |
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Abstract We propose a new algorithm for the error correction of scanning positions in ptychographic microscopy. Since the scanning positions are varied mechanically by moving the illuminating probes laterally, the scanning errors will accumulate at multiple positions, greatly reducing the reconstruction quality of a sample. To correct the scanning errors, we use the correlation analysis for the diffractive data combining with the additional constraint of dual wavelengths. This significantly improves the quality of ptychographic microscopy. Optical experiments verify the proposed algorithm for two samples including a resolution target and a fibroblast.
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Received: 17 November 2019
Published: 24 March 2020
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| Fund: Supported by the National Natural Science Foundation of China under Grant No. 61575197, the Fusion Foundation of Research and Education of CAS, the Youth Innovation Promotion Association of CAS (2017489), the University of Chinese Academy of Sciences, and the Natural Science Foundation of Hebei Province of China (F2018402285). |
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