| Original Articles |
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Variation of Different Characteristic Parameters of Pentacene/Poly(Methyl Methacrylate) Transistors under Electric Stress |
| DONG Gui-Fang, LIU Qing-Di, WANG Li-Duo, QIU Yong |
| Key Laboratory of Organic-Optoelectronic and Molecular Engineering of the Ministry of Education, Department of Chemistry, Tsinghua University, Beijing 100084 |
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| Cite this article: |
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DONG Gui-Fang, LIU Qing-Di, WANG Li-Duo et al 2008 Chin. Phys. Lett. 25 3375-3377 |
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Abstract By investigating the variation of different characteristic parameters of pentacene/poly(methyl methacrylate) transistors suffered from electric stress in an environment without O2, H2O and light, we deduce lifetimes of the transistors by different criterion parameters. Defined by the time for the parameters changing one half, the lifetime is different from the minimum of 7h (using on/off current ratio as the criterion parameter) to the maximum of 2.38×s108h (using transconductance as the criterion parameter). We also find that, under our experimental conditions, the main reason that affects the stabilities of the device is the increase of shallow traps formed in the organic semiconductors.
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| Keywords:
72.80.-r
73.50.-h
73.40.-c
71.20.-b
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Received: 19 February 2008
Published: 29 August 2008
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| PACS: |
72.80.-r
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(Conductivity of specific materials)
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73.50.-h
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(Electronic transport phenomena in thin films)
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73.40.-c
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(Electronic transport in interface structures)
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71.20.-b
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(Electron density of states and band structure of crystalline solids)
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