Chin. Phys. Lett.  2008, Vol. 25 Issue (7): 2407-2409    DOI:
Original Articles |
Modification of AFM Tips for Facilitating Picking-up of Nanoparticles
WANG Peng1,3, YANG Hai-Jun1,3, WANG Hua-Bin1,3, LI Hai1, WANG Xin-Yan1,3, WANG Ying1, LÜ Jun-Hong1 , LI Bin1, ZHANG Yi1, HU Jun1,2
1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 2018002Bio-X Life Science Research Center, College of Life Science and Biotechnology, Shanghai Jiao Tong University, Shanghai 2002403Graduate School of the Chinese Academy of Sciences, Beijing 100049
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WANG Peng, YANG Hai-Jun, WANG Hua-Bin et al  2008 Chin. Phys. Lett. 25 2407-2409
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Abstract The radius of atomic force microscope (AFM) tip is a key factor that influences nonspecific interactions between AFM tip and nanoparticles. Generally, a tip with larger radius contributes to a higher efficiency of picking up nanoparticles. We provide two methods for modifying the AFM tip: one is to wear a tip apex on a solid substrate and the other is to coat a tip with poly (dimethylsiloxane) (PDMS). Both the approaches can enhance the adhesion force between the tip and nanoparticles by increasing tip radius. The experimental results show that a modified tip, compared to an unmodified one, achieves six-fold efficiency improvement in the capture of targeted colloidal gold nanoparticles.
Keywords: 07.79.Lh      81.07.Lk     
Received: 02 January 2008      Published: 26 June 2008
PACS:  07.79.Lh (Atomic force microscopes)  
  81.07.Lk (Nanocontacts)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2008/V25/I7/02407
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WANG Peng
YANG Hai-Jun
WANG Hua-Bin
LI Hai
WANG Xin-Yan
WANG Ying
Jun-Hong
LI Bin
ZHANG Yi
HU Jun
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