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Double-Exponentially Decayed Photoionization in CREI Effect: Numerical Experiment on 3D H2+ |
| LI Feng1,2;WANG Ting-Ying1,2;ZHANG Gui-Zhong1,2;XIANG Wang-Hua1,2;W. T. Hill III3 |
| 1College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 3000722Key Lab of Optoelectronic Information and Technical Science (Ministry of Education), Tianjin University, Tianjin 3000723Institute for Physical Science and Technology, University of Maryland at College Park, MD20742, USA |
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| Cite this article: |
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LI Feng, WANG Ting-Ying, ZHANG Gui-Zhong et al 2008 Chin. Phys. Lett. 25 465-467 |
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Abstract On the platform of the 3D H2+ system, we perform a numerical simulation of its photoionization rate under excitation of weak to intense laser intensities with varying pulse durations and wavelengths. A novel method is proposed for calculating the photoionization rate: a double exponential decay of ionization probability is best suited for fitting this rate. Confirmation of the well-documented charge-resonance-enhanced ionization (CREI) effect at medium laser intensity and finding of ionization saturation at high light intensity corroborate the robustness of the suggested double-exponential decay process. Surveying the spatial and temporal variations of electron
wavefunctions uncovers a mechanism for the double-exponentially decayed photoionization probability as onset of electron ionization along extra degree of freedom. Henceforth, the new method makes clear the origins of peak features in photoionization rate versus internuclear separation. It is believed that this multi-exponentially decayed ionization mechanism is applicable to systems with more degrees of motion.
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| Keywords:
31.15.Qg
33.80.Rv
32.80.Rm
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Received: 23 August 2007
Published: 30 January 2008
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| PACS: |
31.15.Qg
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33.80.Rv
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(Multiphoton ionization and excitation to highly excited states (e.g., Rydberg states))
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32.80.Rm
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(Multiphoton ionization and excitation to highly excited states)
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