Chin. Phys. Lett.  2008, Vol. 25 Issue (12): 4368-4370    DOI:
Original Articles |
Achieving Thin Films with Micro/Nano-Scale Controllable Morphology by Glancing Angle Deposition Technique
JIANG Shao-Ji, WANG Chao-Yi, TANG Ji-Jia, HU Lin-Xin
State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, Guangzhou 510275
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JIANG Shao-Ji, WANG Chao-Yi, TANG Ji-Jia et al  2008 Chin. Phys. Lett. 25 4368-4370
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Abstract

We demonstrate that thin films with micro/nanometre controllable morphology can be fabricated by the glancing angle deposition (GLAD) technique which is a physical vapour deposition technique. In this technique, there are parameters which determine the morphology of the thin films: the incident angle, ratio of the deposition rate with respect to the substrate rotation rate, nature of the material being deposited, etc. We fabricate the morphology of column, pillar, helices, zigzag and study the parameters which determine morphology by given some examples of SEM.

Keywords: 68.55.-a      61.46.-w      81.15.-z     
Received: 12 September 2008      Published: 27 November 2008
PACS:  68.55.-a (Thin film structure and morphology)  
  61.46.-w (Structure of nanoscale materials)  
  81.15.-z (Methods of deposition of films and coatings; film growth and epitaxy)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2008/V25/I12/04368
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JIANG Shao-Ji
WANG Chao-Yi
TANG Ji-Jia
HU Lin-Xin
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