Chin. Phys. Lett.  2007, Vol. 24 Issue (9): 2707-2709    DOI:
Original Articles |
Ultraviolet Phototransistors on AlGaN/GaN Heterostructures
CHEN Chen1,2;JIANG Wen-Hai2;REN Chun-Jiang2;LI Zhong-Hui2;JIAO Gang2;DONG Xun2;CHEN Tang-Sheng2
1Department of Physics, Nanjing University, Nanjing 2100932National Key Laboratory of Monolithic Integrated Circuits and Modules, Nanjing Electronic Devices Institute, Nanjing 210016
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CHEN Chen, JIANG Wen-Hai, REN Chun-Jiang et al  2007 Chin. Phys. Lett. 24 2707-2709
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Abstract We report on the fabrication and characterization of phototransistors based on AlGaN/GaN heterostructure grown over 6H-SiC substrates. The device has two functions: as a high electron mobility transistor (HEMT) and an ultraviolet photodetector at the same time. As an HEMT, its maximum transconductance is 170mS/mm, while the minimum cutoff frequency fT and the maximum oscillation frequency fm are 19 and 35GHz, respectively. As a photodetector, the device is visible blind, with an ultraviolet/green contrast of three orders of magnitude, and a responsivity as high as 1700A/W at the wavelength of 362nm.
Keywords: 85.60.Dw      73.61.Ey      78.66.Fd     
Received: 13 February 2007      Published: 16 August 2007
PACS:  85.60.Dw (Photodiodes; phototransistors; photoresistors)  
  73.61.Ey (III-V semiconductors)  
  78.66.Fd (III-V semiconductors)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2007/V24/I9/02707
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CHEN Chen
JIANG Wen-Hai
REN Chun-Jiang
LI Zhong-Hui
JIAO Gang
DONG Xun
CHEN Tang-Sheng
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