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Large Positive and Negative Lateral Displacements from Total Internal Reflection Configuration with a Weakly Absorbing Dielectric Film |
| DING Fang-Gang1;CHEN Xi1;LI Chun-Fang1,2 |
| 1Department of Physics, Shanghai University, Shanghai 2004442State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119 |
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DING Fang-Gang, CHEN Xi, LI Chun-Fang 2007 Chin. Phys. Lett. 24 1926-1929 |
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Abstract It is theoretically shown that the simultaneously large positive and negative lateral displacements will appear when the resonant condition is satisfied for a TE-polarized light beam reflected from the total internal reflection configuration with a weakly absorbing dielectric film. Appearance of the enhanced negative lateral displacement is relative to the incidence angle, absorption of the thin film and its thickness. If we select an appropriate weakly absorbing dielectric film and its thickness, the simultaneously enhanced positive and negative lateral displacements will appear at different resonant angles. These phenomena may lead to convenient measurements and interesting applications in optical devices.
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| Keywords:
42.25.Gy
78.20.Bh
42.25.Ja
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Received: 21 January 2007
Published: 25 June 2007
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| PACS: |
42.25.Gy
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(Edge and boundary effects; reflection and refraction)
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78.20.Bh
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(Theory, models, and numerical simulation)
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42.25.Ja
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(Polarization)
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