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Subwavelength Imaging in a One-Dimensional Metal-Dielectric Structure |
| LI Ming-Yu;GU Pei-Fu;ZHANG Jin-Long;LI Yi-Yu;LIU Xu |
| State Key Laboratory for Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027 |
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| Cite this article: |
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LI Ming-Yu, GU Pei-Fu, ZHANG Jin-Long et al 2007 Chin. Phys. Lett. 24 3539-3542 |
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Abstract We analyse the dispersion relation of a one-dimensional (1D) metal-dielectric (MD) structure for H-polarized light (i.e. the magnetic field is parallel to the interfaces of the layers) and use the transfer matrix method to simulate the subwavelength image effect through the 1D-MD structure. The structure operates in the self-collimation regime, and does not involve negative refraction or amplification of evanescent waves. The Fabry--Perot resonance effect is studied in order to obtain optimum parameters for maximum transmission. A resolution of λ/10 for a single point source is achieved when the thickness of the 1D-MD is about 300nm. Taking into account the actual
values of the dielectric constants of the metal (silver) and the dielectric (HfO2) layers, we find that a silver/HfO2 stack, with suitable parameters, has a resolution of λ/5 at visible wavelengths.
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| Keywords:
78.20.-e
42.70.Qs
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Received: 25 June 2007
Published: 03 December 2007
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| PACS: |
78.20.-e
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(Optical properties of bulk materials and thin films)
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42.70.Qs
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(Photonic bandgap materials)
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[1]Pendry J B 2000 Phys. Rev. Lett. 85 3966
[2] Shelby R A, Smith D and Schultz S 2001 Science 292 77
[3] Fang N, Lee H, Sun C and Zhang X 2005 Science 308 534
[4] Melville D O S, Blaikie R J and Wolf C R 2005 Opt.Express 13 2127
[5] Luo C Y, Johnson S G, Joannopoulos J D and Pendry J B 2003 Phys. Rev. B 68 045115
[6] Parimi P V, Lu W T, Vodo P and Sridharm S 2003 Nature 426 404
[7] Li Z Y and Lin L L 2003 Phys. Rev. B 68 245110
[8] Belov P A, Simovski C R and Ikonen P 2005 Phys. Rev. B 71 193105
[9] Li Y Y, Gu P F, Zhang J L, Li M Y and Liu X 2006 Appl. Phys.Lett. 68 151911
[10] Ramakrishna S A, Pendry J B, Wiltshire M C K and Stewart W J 2003 J. Mod. Opt. 50 1419
[11] Belov P A and Hao Y 2006 Phys. Rev. B 73 113110
[12] Shin H and Fan S H 2006 Appl. Phys. Lett. 89 151102
[13] Webb K J and Yang M 2006 Opt. Lett. 31 2130
[14] Yeh P, Yariv A and Hong C S 1977 J. Opt. Soc. Am. 67 423
[15] Kong J A , Wu B L and Zhang Y 2002 Microwave Opt.Technol. Lett. 33 136
[16] Johnson P B and Christy R W 1972 Phys. Rev. B 6 4370
[17] Thielsch R, Gatto A, Heber J and Kaiser N 2002 Thin.Solid. Films 410 86
[18] Kuzmiak V and Maradudin A A 1996 Phys. Rev. B 55 7427 |
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