Chin. Phys. Lett.  2007, Vol. 24 Issue (10): 2823-2826    DOI:
Original Articles |
Quantitative Evaluation Methods of In-Line X-Ray Phase Contrast Techniques
LI Chen;LI Zheng;LI Cheng-Quan;YU Ai-Min
Department of Engineering Physics, Tsinghua University, Beijing 100084
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LI Chen, LI Zheng, LI Cheng-Quan et al  2007 Chin. Phys. Lett. 24 2823-2826
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Abstract By revealing the relationship between edge visibility and imaging parameters in in-line phase contrast imaging (PCI), we propose a method to quantitatively measure the contribution of absorption and phase shift from acquired images. We also prove that edge visibility will grow with the increasing source-object distance and object-detector distance. The result is validated by relative phase factor and by experiments conducted on a microfocus x-ray source. This method provides a new approach to evaluate in-line PCI images and is helpful for deciding imaging parameters.
Keywords: 41.50.+h      42.30.Va     
Received: 02 February 2007      Published: 20 September 2007
PACS:  41.50.+h (X-ray beams and x-ray optics)  
  42.30.Va (Image forming and processing)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2007/V24/I10/02823
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LI Chen
LI Zheng
LI Cheng-Quan
YU Ai-Min
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