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A Reflected Terahertz-Emission Microscopy |
| YANG Yu-Ping1,2;YAN Wei2;WANG Li2 |
| 1Academy of Physics and Electronic Engineering, Central University for Nationalities, Beijing 100081
2Laboratory of Optical Physics, Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080 |
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| Cite this article: |
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YANG Yu-Ping, YAN Wei, WANG Li 2007 Chin. Phys. Lett. 24 169-171 |
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Abstract A novel reflected terahertz-emission microscopy is proposed and developed for improving the spatial resolution of THz imaging. When attaching a bow-tie antenna directly onto a thin generation crystal, the reflected THz waves can be collected and detected by a photoconductive antenna, and the spatial resolution is decided by the diameter of focused pump beam. In this way, the detected resolution can be largely improved and tunable. The configuration and characteristics of this microscopy are described in detail.
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| Keywords:
68.37.Vj
68.37.Uv
95.85.Gn
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Published: 01 January 2007
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| PACS: |
68.37.Vj
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(Field emission and field-ion microscopy)
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68.37.Uv
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(Near-field scanning microscopy and spectroscopy)
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95.85.Gn
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(Far infrared (10-300 μm))
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