Optical Erasure Characteristics of Holograms in Batch Thermal-Fixing

Chin. Phys. Lett.

2006, Vol. 23

Issue (10): 2749-2752 DOI:

Original Articles

Optical Erasure Characteristics of Holograms in Batch Thermal-Fixing

JIANG Zhu-Qing;TAO Shi-Quan;YUAN Wei;LIU Guo-Qing;WANG Da-Yong

College of Applied Sciences, Beijing University of Technology, Beijing 100022

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JIANG Zhu-Qing, TAO Shi-Quan, YUAN Wei et al 2006 Chin. Phys. Lett. 23 2749-2752

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Abstract The optical erasure dynamics in a batch-thermal fixing scheme of holographic storage in photorefractive crystals is investigated theoretically and experimentally. The inter-batch optical erasure time constant τ_F is introduced to specify the optical erasure to compensated gratings, and measured in a sophisticated experiment. The experimental result shows that τ_F is much longer than the intra-batch optical erasure time constant τ_E. The difference between τ_F and τ_E is fundamental for enhancing nonvolatile storage density.

Keywords: 42.40.Pa 42.40.Ht 42.20.Lx

Published: 01 October 2006

PACS:	42.40.Pa	(Volume holograms)
	42.40.Ht	(Hologram recording and readout methods)
	42.20.Lx

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https://cpl.iphy.ac.cn/ OR https://cpl.iphy.ac.cn/Y2006/V23/I10/02749

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	JIANG Zhu-Qing
	TAO Shi-Quan
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	WANG Da-Yong

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