| Original Articles |
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High-Density Read-Only Memory Disc with Ag11In12Sb51Te26 Super-Resolution Mask Layer |
| ZHANG Feng;WANG Yang;XU Wen-Dong;SHI Hong-Ren,WEI Jing-Song;GAN Fu-Xi |
| Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 |
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| Cite this article: |
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ZHANG Feng, WANG Yang, XU Wen-Dong et al 2004 Chin. Phys. Lett. 21 1973-1975 |
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Abstract A novel read-only memory (ROM) disc with an Ag11In12Sb51Te26 super-resolution mask layer is proposed and investigated for the first time to our knowledge. The carrier-to-noise ratio of more than 40dB could be obtained from small pits (380nm), which are below the readout resolution limit (400nm), in our dynamic setup with a wavelength of 632.8nm and numerical aperture of 0.40. Dependences of carrier-to-noise ratio on readout power, readout velocity and film thickness are studied. The results show that the optimum film thickness is 20-50nm and the corresponding carrier-to-noise ratio is more than 40dB at readout power of 4mW and readout velocity of 2m/s in our experiment. The super-resolution readout mechanism for this ROM disc is also discussed.
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| Keywords:
42.70.Ln
42.70.Nq
42.79.Vb
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Published: 01 October 2004
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| PACS: |
42.70.Ln
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(Holographic recording materials; optical storage media)
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42.70.Nq
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(Other nonlinear optical materials; photorefractive and semiconductor materials)
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42.79.Vb
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(Optical storage systems, optical disks)
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