| Original Articles |
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Influence of Nonlinear Absorption on Z-Scan Measurements of Nonlinear Refraction |
| LIU Zhi-Bo;TIAN Jian-Guo;ZANG Wei-Ping;ZHOU Wen-Yuan;ZHANG Chun-Ping;ZHANG Guang-Yin |
| Photonics Center, Institute of Physics, Nankai University, Tianjin 300071 |
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| Cite this article: |
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LIU Zhi-Bo, TIAN Jian-Guo, ZANG Wei-Ping et al 2003 Chin. Phys. Lett. 20 509-512 |
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Abstract A simple division of close-aperture Z-scan curve by open-aperture Z-scan is conveniently used to obtain the nonlinear refractive index. It usually causes an error, which even reaches up to over 50% for Z-scan measurements with a pinhole or a medium with a high nonlinear absorption. Here the influence of nonlinear absorption on the determination of nonlinear refraction by Z-scan is analysed. We suggest that the error can be reduced greatly by a simple analysis of the symmetric features (symmetric method) of Z-scan curves from the
closed-aperture Z-scan curve. As an example, experiments were carried out on CS2 solution of C60 derivative, symmetric method agrees well with exact simulation.
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| Keywords:
42.65.-k
42.65.Jx
41.20.Jb
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Published: 01 April 2003
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| PACS: |
42.65.-k
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(Nonlinear optics)
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42.65.Jx
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(Beam trapping, self-focusing and defocusing; self-phase modulation)
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41.20.Jb
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(Electromagnetic wave propagation; radiowave propagation)
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