Chin. Phys. Lett.  2002, Vol. 19 Issue (4): 563-565    DOI:
Original Articles |
Dielectric Enhancement and Maxwell-Wagner Effect in Polycrystalline BaTiO3/Ba0.2Sr0.8TiO3 Multilayered Thin Films
GE Shui-Bing;SHEN Ming-Rong;NING Zhao-Yuan
Department of Physics, Suzhou University, Suzhou 215006
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GE Shui-Bing, SHEN Ming-Rong, NING Zhao-Yuan 2002 Chin. Phys. Lett. 19 563-565
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Abstract Polycrystalline BaTiO3/Ba0.2Sr0.8TiO3 multilayer thin films were fabricated by pulsed-laser deposition onto Pt/Ti/SiO2/Si substrates with various stacking periodicities. The dielectric constant of the films was obviously enhanced with decrease of the individual layer thickness, while the dielectric loss was kept at a low level comparable to that of the pure Ba0.6Sr0.4TiO3 thin films. The Maxwell-Wagner model is used to explain the experimental data.
Keywords: 77.55.+f      68.65.+g      81.15.Fg     
Published: 01 April 2002
PACS:  77.55.+f  
  68.65.+g  
  81.15.Fg (Pulsed laser ablation deposition)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2002/V19/I4/0563
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