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Dielectric Enhancement and Maxwell-Wagner Effect in Polycrystalline BaTiO3/Ba0.2Sr0.8TiO3 Multilayered Thin Films
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GE Shui-Bing;SHEN Ming-Rong;NING Zhao-Yuan |
Department of Physics, Suzhou University, Suzhou 215006 |
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Cite this article: |
GE Shui-Bing, SHEN Ming-Rong, NING Zhao-Yuan 2002 Chin. Phys. Lett. 19 563-565 |
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Abstract Polycrystalline BaTiO3/Ba0.2Sr0.8TiO3 multilayer thin films were fabricated by pulsed-laser deposition onto Pt/Ti/SiO2/Si substrates with various stacking periodicities. The dielectric constant of the films was obviously enhanced with decrease of the individual layer thickness, while the dielectric loss was kept at a low level comparable to that of the pure Ba0.6Sr0.4TiO3 thin films. The Maxwell-Wagner model is used to explain the experimental data.
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Keywords:
77.55.+f
68.65.+g
81.15.Fg
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Published: 01 April 2002
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