| Original Articles |
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Ionization of Hafnium L-Shell by Electron Impact |
| LUO Zheng-Ming;FU Yu-Chuan;AN Zhu;PENG Xiu-Feng;HE Fu-Qing;LONG Xian-Guan |
| Key Laboratory for Radiation Physics and Technology of
Education Ministry of China, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064 |
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| Cite this article: |
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LUO Zheng-Ming, FU Yu-Chuan, AN Zhu et al 2002 Chin. Phys. Lett. 19 1610-1612 |
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Abstract A lower-electron beam has been directed on to a hafnium thin
target with thick backing to investigate the process of L-shell ionization. By using a Si (Li) detector to count the x-rays from the L-subshell, the partial and total production cross sections and mean ionization cross sections versus electron energies were deduced simultaneously (from threshold to 36 keV). The influence of the electron reflected from the backing on measurements was corrected. The path of the electron multi-scattered in the target itself was also calculated by using the Monte Carlo programme (EGS4). A comparison with both theoretical predictions is given.
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| Keywords:
34.80.Dp
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Published: 01 November 2002
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| PACS: |
34.80.Dp
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(Atomic excitation and ionization)
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