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Fabrication of Nanoparticle Pattern Through Atomic Force
Microscopy Tip-Induced Deposition on Modified Silicon Surfaces |
| LIAO Jian-Hui;HUANG Lan;GU Ning |
| 1National Laboratory of Molecular and Biomolecular Electronics, Southeast University, Nanjing 210096
2Center for Nano-Scale Scicence and Technology, Southeast University, Nanjing 210096 |
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| Cite this article: |
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LIAO Jian-Hui, HUANG Lan, GU Ning 2002 Chin. Phys. Lett. 19 134-136 |
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Abstract With an atomic force microscopy (AFM) tip used as a “nib”and gold colloidal particles as “ink”, patterns of gold colloidal particles have been deposited successfully from AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane, i.e. (3-mercaptopropyl)-triethoxysilane. This was used as an adhesion agent and can immobilize the nanoparticles delivered from AFM tip onto the substrate surface.
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| Keywords:
85.40.Sz
85.40.Hp
85.65.+h
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Published: 01 January 2002
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| PACS: |
85.40.Sz
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(Deposition technology)
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85.40.Hp
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(Lithography, masks and pattern transfer)
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85.65.+h
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(Molecular electronic devices)
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