Chin. Phys. Lett.  2001, Vol. 18 Issue (8): 1090-1091    DOI:
Original Articles |
Electron Heat Diffusivity in the HT-7 Tokamak with Si-Coating Wall
ZHANG Xian-Mei;WAN Bao-Nian;RUAN Huai-Lin;WU Zhen-Wei
Institute of Plasma Physics, Chinese Academy of Sciences, P.O.Box 1126, Hefei 230031
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ZHANG Xian-Mei, WAN Bao-Nian, RUAN Huai-Lin et al  2001 Chin. Phys. Lett. 18 1090-1091
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Abstract Electron heat diffusivity inferred from the electron power balance was studied in the ohmically heated plasma on an HT-7 tokamak. The results obtained before and after siliconization were compared and it is found that the diffusivity is reduced obviously in the half of the outer region (r/a > 0.5) after siliconization, which was the reason why energy confinement was improved after siliconization.
Keywords: 52.25.Fi      52.55.Dy     
Published: 01 August 2001
PACS:  52.25.Fi (Transport properties)  
  52.55.Dy (General theory and basic studies of plasma lifetime, particle and heat loss, energy balance, field structure, etc.)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2001/V18/I8/01090
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ZHANG Xian-Mei
WAN Bao-Nian
RUAN Huai-Lin
WU Zhen-Wei
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