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Backward Secondary Electron Emission Yield of Thick Targets Induced by MeV Ions |
| JIANG Lei;ZHOU Zhu-Ying;ZHAO Guo-Qing |
| Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433 |
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| Cite this article: |
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JIANG Lei, ZHOU Zhu-Ying, ZHAO Guo-Qing 2000 Chin. Phys. Lett. 17 691-693 |
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Abstract The backward secondary electron emission yields of MeV ions (H+, He+, He++, Cl, Si, and Cu ) impinging on thick carbon and gold targets are studied. The measured results for H+ (1 MeV≤ E≤ 5MeV) on carbon are proportional to the electronic stopping power. Our experimental data and fitting formula of yields for H+ (1 MeV≤ E≤ 4.5 MeV) impacting Au are compared with the theoretical expectation. The influence of the collective field and the charge state of ions on the secondary electron emission yield is discussed.
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| Keywords:
79.20.Rf
34.50.Bw
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Published: 01 September 2000
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| PACS: |
79.20.Rf
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(Atomic, molecular, and ion beam impact and interactions with surfaces)
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34.50.Bw
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(Energy loss and stopping power)
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