Chin. Phys. Lett.  2000, Vol. 17 Issue (11): 827-828    DOI:
Original Articles |
Au/Ti/p-Diamond Ohmic Contacts Prepared by Radio-Frequency Sputtering
ZHEN Cong-Mian;LIU Xue-Qin;YAN Zhi-Jun;GONG Heng-Xiang;WANG Yin-Yue
Department of Physics, Lanzhou University, Lanzhou 730000
Cite this article:   
ZHEN Cong-Mian, LIU Xue-Qin, YAN Zhi-Jun et al  2000 Chin. Phys. Lett. 17 827-828
Download: PDF(169KB)  
Export: BibTeX | EndNote | Reference Manager | ProCite | RefWorks
Abstract The as-deposited Au/Ti/p-diamond contacts prepared by rf sputtering are ohmic. The ohmic characteristics of the contacts are improved after annealing. As for the as-deposited and annealed contacts, the specific contact resistivities of 2.886 x 10-3 and 2.040 x 10-4 Ω.cm2 are obtained, respectively. The x-ray photoelectron spectroscopy analysis indicates that the titanium carbide formation occurs at the interface between titanium and the diamond substrate in the as-deposited state, and no TiO2 is observed.
Keywords: 73.40.Ns      73.40.Cg      68.48.+f     
Published: 01 November 2000
PACS:  73.40.Ns (Metal-nonmetal contacts)  
  73.40.Cg (Contact resistance, contact potential)  
  68.48.+f  
TRENDMD:   
URL:  
https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2000/V17/I11/0827
Service
E-mail this article
E-mail Alert
RSS
Articles by authors
ZHEN Cong-Mian
LIU Xue-Qin
YAN Zhi-Jun
GONG Heng-Xiang
WANG Yin-Yue
Related articles from Frontiers Journals
[1] CHEN Shun-Sheng, YANG Chang-Ping, LUO Xiao-Jing, Bä, rner K., Medvedeva I. V.. Alternating-Current Transport Properties of the Interface between Nd0.7Sr0.3MnO3 Ceramic and a Ag Electrode[J]. Chin. Phys. Lett., 2012, 29(2): 827-828
[2] ZENG Chang, ZHANG Shu-Ming**, WANG Hui, LIU Jian-Ping, WANG Huai-Bing, LI Zeng-Cheng, FENG Mei-Xin, ZHAO De-Gang, LIU Zong-Shun, JIANG De-Sheng, YANG Hui. Formation of Low-Resistant and Thermally Stable Nonalloyed Ohmic Contact to N-Face n-GaN[J]. Chin. Phys. Lett., 2012, 29(1): 827-828
[3] CHANG Hong, **, ZHAO Yong-Gang . Enhanced Magnetic and Ferroelectric Properties and Current-Voltage Hysteresis by Addition of La and Ti to BiFeO3 on 0.7%Nb−SrTiO3[J]. Chin. Phys. Lett., 2011, 28(6): 827-828
[4] ZHAO Geng, CHENG Xiao-Man, **, TIAN Hai-Jun, DU Bo-Qun, LIANG Xiao-Yu . Improved Performance of Pentacene Organic Field-Effect Transistors by Inserting a V2O5 Metal Oxide Layer[J]. Chin. Phys. Lett., 2011, 28(12): 827-828
[5] GANG Jian-Lei, LI Song-Lin, LIAO Zhao-Liang, MENG Yang, LIANG Xue-Jin, CHEN Dong-Min. Clockwise vs Counter-Clockwise I-V Hysteresis of Point-Contact Metal-Tip/Pr0.7 Ca0.3MnO3/Pt Devices[J]. Chin. Phys. Lett., 2010, 27(2): 827-828
[6] HU Zi-Yang, CHENG Xiao-Man, , WU Ren-Lei, WANG Zhong-Qiang, YIN Shou-Gen,. Performance of Organic Field Effect Transistors with Self-Improved Cu/Organic Interfaces[J]. Chin. Phys. Lett., 2009, 26(3): 827-828
[7] LI Hai-Hong, LI Dong-Mei, LI Yuan, GAO Kun, LIU De-Sheng, XIE Shi-Jie. Charge Injection and Transport in Metal/Polymer Chains/Metal Sandwich Structure[J]. Chin. Phys. Lett., 2008, 25(8): 827-828
[8] FENG Chun, WANG Xiao-Liang, YANG Cui-Bai, XIAO Hong-Ling, ZHANG Ming-Lan, JIANG Li-Juan, TANG Jian, HU Guo-Xin, WANG Jun-Xi, WANG Zhan-Guo. Effect of CO on Characteristics of AlGaN/GaN Schottky Diode[J]. Chin. Phys. Lett., 2008, 25(8): 827-828
[9] WANG Xin-Hua, WANG Xiao-Liang, FENG Chun, XIAO Hong-Ling, YANG Cui-Bai, WANG Jun-Xi, WANG Bao-Zhu, RAN Jun-Xue, WANG Cui-Mei. Hydrogen Sensors Based on AlGaN/AlN/GaN Schottky Diodes[J]. Chin. Phys. Lett., 2008, 25(1): 827-828
[10] N. Tugluoglu, S. Karadeniz, S. Acar, M. Kasap. Temperature-Dependent Barrier Characteristics of Inhomogeneous In/p-Si (100) Schottky Barrier Diodes[J]. Chin. Phys. Lett., 2004, 21(9): 827-828
[11] UAN Jin-She, CHEN Guang-De, QI Ming, LI Ai-Zhen, XIE Lun-Jun. Surface Properties of Unintentionally Doped GaN Film and Its Contact Behaviour with Ni/Cr/Au Compound Metals[J]. Chin. Phys. Lett., 2003, 20(10): 827-828
[12] JIANG Yu-Long, RU Guo-Ping, LU Fang, QU Xin-Ping, LI Bing-Zong, LI Wei, LI Ai-Zhen. Schottky Barrier Height Inhomogeneity of Ti/n-GaAs Contact Studied by the I-V-T Technique[J]. Chin. Phys. Lett., 2002, 19(4): 827-828
[13] XU Wen-tao, LI Xiang, WANG Hai-qian, YANG Li, WU Zi-qin, HOU Jian-guo. Nucleation and Growth Characteristics of Metal Films on C60(111) Surface[J]. Chin. Phys. Lett., 1998, 15(4): 827-828
[14] ZHENG Hai-peng, ZHANG Rui-feng, HUANG Jing-song, LIU Shi-yong, SHEN Jia-cong. I - V Characteristics of Metal/Polynitrobenzene Junctions[J]. Chin. Phys. Lett., 1997, 14(5): 827-828
[15] LIU Xing-zhao, YANG Bang-chao, JIA Yu-min, LI Yan-rong. Electrical Characteristics of Metal Contacts to Boron Doped Polycrystalline Semiconducting Diamond Thin Films [J]. Chin. Phys. Lett., 1996, 13(7): 827-828
Viewed
Full text


Abstract