Chin. Phys. Lett.  1998, Vol. 15 Issue (8): 615-616    DOI:
Original Articles |
Effect of the Compressive Stress for the Growth of Cubic-BN Film
ZHAO Yong-nian1,2;ZOU Guang-tian1;HE Zhi1;ZHAO Bing2;WANG Bo1
1State Key Laboratory for Superhard Materials, Jilin University, Changchun 130023 2Key Laboratory for Supramolecular Structure and Spectroscopy, Jilin University, Changchun 130023
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ZHAO Yong-nian, ZOU Guang-tian, HE Zhi et al  1998 Chin. Phys. Lett. 15 615-616
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Abstract In this work, it is found that the compressive stress on the surface of cubic-BN (c-BN) film is all smaller than that inside c-BN film and after a longer period, the depositing matter mainly is of hexagonal-BN phase rather than c-BN phase, those just are the reason why a pure thicker c-BN film cannot, as yet, be obtained. Up to now the lowest IR peak position of 1004.7cm-1 detected from a broken and part delaminated c-BN film may be one close to the stressless c-BN.
Keywords: 81.15.Jj      81.15.Np      52.80.Vp     
Published: 01 August 1998
PACS:  81.15.Jj (Ion and electron beam-assisted deposition; ion plating)  
  81.15.Np (Solid phase epitaxy; growth from solid phases)  
  52.80.Vp (Discharge in vacuum)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1998/V15/I8/0615
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ZHAO Yong-nian
ZOU Guang-tian
HE Zhi
ZHAO Bing
WANG Bo
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