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In-Situ Control of Oxygen Fugacity in Water-Free Systems at High Temperature and High Pressure |
LI He-ping1;XIE Hong-sen1;GUO Jie1;ZHANG Yue-ming1;XU Zu-ming1;XU Ji-an2 |
1Material Laboratory of the Earths Interior, Institute of Geochemistry, Chinese Academy of Sciences, Guiyang 550002
2Institute of Geosciences, Academia Sinica, Taipei
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Cite this article: |
LI He-ping, XIE Hong-sen, GUO Jie et al 1998 Chin. Phys. Lett. 15 162-164 |
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Abstract By using two oxygen specific electrolyte discs and applying a dc voltage between the sample and an oxygen buffer, oxygen can be driven into or pumped from the sample at a fixed temperature and pressure. By measuring the voltage between the sample and a reference buffer, the oxygen fugacity in the sample is simultaneously monitored. Therefore, the oxygen fugacity in the sample at high temperature and high pressure can be in situ controlled independently of temperature and pressure.
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Keywords:
07.35.+k
62.50.+p
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Published: 01 March 1998
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PACS: |
07.35.+k
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(High-pressure apparatus; shock tubes; diamond anvil cells)
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62.50.+p
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Abstract
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