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Observation of the Si(100)-(2 x 2) Phase and Measurements of Low Energy Electron Diffraction I-V Curves |
| HU Xiaoming;LIN Zhangda |
| State Key Laboratory of Surface Physics, Institute of Physics, Academia Sinica, Beijing 100080 |
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| Cite this article: |
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HU Xiaoming, LIN Zhangda 1995 Chin. Phys. Lett. 12 557-560 |
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Abstract A new phase of (2x2) has been observed as a result of hydrogen ion sputter etching on a clean reconstructed Si(100)-(2x1) surface using low energy electron diffraction (LEED). It has been found that the (2x1) surface first transformed into a metastable c( 4 x 4 ) phase following hydrogen ion etching and after further anneal of the sample, a (2x2) phase can be obtained. Intensity vs electron energy (I-V) curves for the
Si(100)-(2x2) pattern have been measured using a special video LEED system.
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| Keywords:
68.35.Rh
61.14.-x
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Published: 01 September 1995
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