Determination of Photoelastic Constant Ratio of the Two Components in Ge<suB>x</suB>Si<suB>1-x</suB>/Si Superlattice

Chin. Phys. Lett.

1992, Vol. 9

Issue (4): 213-216 DOI:

Original Articles

Determination of Photoelastic Constant Ratio of the Two Components in Ge_xSi_1-x/Si Superlattice

JIN Ying;ZHANG Shulin;ZHOU Guoliang*;YU Mingren*;QIN Guogang***

Departpent of Physics, and National Laboratory for Artificial Microstructure and Mesmcopic Physics, Peking University, Beijing 100871 *Surface Physics Laboratory, Fudan University, Shanghai 200433 **International Center for Materials Physics, Academia Sinica, Shenyang 110015, and Department of Physics, Peking University, Beijing 100871

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JIN Ying, ZHANG Shulin, ZHOU Guoliang et al 1992 Chin. Phys. Lett. 9 213-216

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Abstract From the intensity ratio of the folded longitudinal acoustic phonons with re-spect to the longitudinal acoustic phonon in a Ge_0.51Si_0.49/Si superlattice (SL),we obtained a photoelastic constant. ratio of 6.6 for Ge_0.51Si_0.49 alloy with re-spect to Si in the SL at wavelength 5145Å, which is 2.6 times greater than that obtainedby [He Phys.Rev. B39(1989) 5919] in a Ge_0.51Si_0.49/Si SL.

Keywords: 78.30.-j 68.55.-a

Published: 01 April 1992

PACS:	78.30.-j	(Infrared and Raman spectra)
	68.55.-a	(Thin film structure and morphology)

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	ZHANG Shulin
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