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DYNAMICAL LOW ENERGY ELECTRON DIFFRACTION ANALYSIS FOR Cs/GRAPHITE(0001)-(√3X√3 ) R30°SURFACE |
| HU Zipu;LI Jia;WU Naijuan |
| Department of Material Science, University of Science and Technology of China, Hefei
Institute of Physics, Academia Sinica , Beijing |
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| Cite this article: |
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HU Zipu, LI Jia, WU Naijuan 1989 Chin. Phys. Lett. 6 20-23 |
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Abstract A model incorporating (Cs-A-ABAB) stacking with Cs atoms chemisorbed in hollow sites 2.70A above the top graphite plane and the two top graphite layers shear-shifted to AA stacking and expanded to a separation of 3.85A is the most reliable structure for Cs/graphite( 0001)- (√3 X√3) surfaces. The coexisting diffraction pattern including the diffraction ring and another set of (√3 X√3 ) diffraction pattern which has a 30°rotation angle with respect to the normal (√3 X√3 ) R30°diffraction pattern could be explained. We consider.this structure to be in a pre-intercalation state.
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| Keywords:
6114H
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Published: 01 January 1989
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