Chin. Phys. Lett.  1986, Vol. 3 Issue (3): 97-100    DOI:
Original Articles |
ON THE SELECTION OF ELECTRON BEAMS FOR THE INTENSITY CALCULATION OF OFFNORMAL PHOTOELECTRON DIFFRACTION
TANG Jingchang*;FENG Kean;HUANG Yi
*Department of Physics, Zhejiang University, Hangzhou Institute of Physics, Academia Sinica, Beijing
Cite this article:   
TANG Jingchang, FENG Kean, HUANG Yi 1986 Chin. Phys. Lett. 3 97-100
Download: PDF(41KB)  
Export: BibTeX | EndNote | Reference Manager | ProCite | RefWorks
Abstract It is shown that the circle of electron beams will be shifted when off-normal photoelectron diffraction (OFF-NPD) instead of the normal photoelectron diffraction(NPD) is used. For the C(2x2)Se-Ni(001) system, the I-E curves of OFF-NPD has been calculated in terms of the shifted circle to select beams in the case of θ=36°. The correct structure constants of surface have been determined, which confirmed earlier NPD and OFF-NPD experimental results.

Published: 01 March 1986
TRENDMD:   
URL:  
https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1986/V3/I3/097
Service
E-mail this article
E-mail Alert
RSS
Articles by authors
TANG Jingchang
FENG Kean
HUANG Yi
Viewed
Full text


Abstract