Chin. Phys. Lett.  1986, Vol. 3 Issue (11): 481-484    DOI:
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PHOTOACOUSTIC MEASUREMENT OF AMORPHOUS SEMICONDUCTOR SUPERLATTICE FILMS
FENG Xiaomei;LIU Xiangna;WANG Zhichao;QIU Shuye*
Physics Department and Institute of Solid State Physics, Nanjing University, Nanjing *Institute of Acoustic, Nanjing University, Nanjing
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FENG Xiaomei, LIU Xiangna, WANG Zhichao et al  1986 Chin. Phys. Lett. 3 481-484
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Abstract We present here the first measurement of photoacoustic spectra (PAS) of a-Si:H/a-SiNx:H multilayers. By converting the PAS signal to absorption coefficient, the blue shift and the broadening of Urbach edge are explained as the results of quantum size effect in superlattice structure.
Published: 01 November 1986
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1986/V3/I11/0481
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FENG Xiaomei
LIU Xiangna
WANG Zhichao
QIU Shuye
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