TY - Chin. Phys. Lett. A1 - Kun Luo, Wei Chen, Li Sheng, and D. Y. Xing T1 - Random-Gate-Voltage Induced Al'tshuler–Aronov–Spivak Effect in Topological Edge States Y1 - 2021-10-11 JF - Chinese Physics Letters JO - Chin. Phys. Lett. SP - 110302EP - VL - 38 IS - 11 UR - https://cpl.iphy.ac.cn N1 - 10.1088/0256-307X/38/11/110302 ER -