TY - Chin. Phys. Lett. A1 - Zhi-Fu Zhu, He-Qiu Zhang, Hong-Wei Liang, Xin-Cun Peng, Ji-Jun Zou, Bin Tang, Guo-Tong Du T1 - Characterization of Interface State Density of Ni/p-GaN Structures by Capacitance/Conductance-Voltage-Frequency Measurements Y1 - 2017-08-08 JF - Chinese Physics Letters JO - Chin. Phys. Lett. SP - 097301EP - VL - 34 IS - 9 UR - https://cpl.iphy.ac.cn N1 - 10.1088/0256-307X/34/9/097301 ER -