Chin. Phys. Lett.  2017, Vol. 34 Issue (4): 040701    DOI: 10.1088/0256-307X/34/4/040701
Wide-Temperature-Range Dielectric Permittivity Measurement under High Pressure
Zhen Yuan1,3, Jin-Long Zhu2,3**, Shao-Min Feng3, Chang-Chun Wang1, Li-Juan Wang2,3, Qing-Qing Liu3, Chang-Qing Jin3**
1Department of Materials Science and Engineering, Linyi University, Linyi 276005
2Center for High Pressure Science and Technology Advanced Research, Beijing 100094
3National Lab for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190
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Zhen Yuan, Jin-Long Zhu, Shao-Min Feng et al  2017 Chin. Phys. Lett. 34 040701
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Abstract Two measurement systems are developed for in-situ dielectric property measurement under high pressure in a wide-temperature range from 77 K to 1273 K. The high-temperature system ranging from room temperature up to 1273 K is equipped with a hexahedron anvils press, while the low-temperature system ranging from liquid nitrogen temperature to normal condition is equipped using the piston cylinder setup with a specially designed sample chamber. Using these configurations, the dielectric property measurement of ferroelectric BaTiO$_{3}$ and multiferroic Tm$_{0.5}$Gd$_{0.5}$MnO$_{3}$ compounds are demonstrated, which proves the validity of the systems through the tuning of the polarization and phase transition boundary by high pressure. These two systems will be equally applicable to a wide variety of electronic and transport property measurements of insulators, semiconductors, as well as battery materials.
Received: 12 December 2016      Published: 21 March 2017
PACS:  07.35.+k (High-pressure apparatus; shock tubes; diamond anvil cells)  
  62.50.-p (High-pressure effects in solids and liquids)  
  77.22.Ch (Permittivity (dielectric function))  
Fund: Supported by the National Basic Research Program of China under Grant No 2009CB623301.
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Zhen Yuan
Jin-Long Zhu
Shao-Min Feng
Chang-Chun Wang
Li-Juan Wang
Qing-Qing Liu
Chang-Qing Jin
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