Chin. Phys. Lett.  2017, Vol. 34 Issue (4): 047501    DOI: 10.1088/0256-307X/34/4/047501
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Periodic Boundary Conditions for Finite-Differentiation-Method Fast-Fourier-Transform Micromagnetics
Jiang-Nan Li, Dan Wei**,
Key Laboratory of Advanced Materials (MOE), School of Materials Science and Engineering, Tsinghua University, Beijing 100084
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Abstract We describe an accurate periodic boundary condition (PBC) called the symmetric PBC in the calculation of the magnetostatic interaction field in the finite-differentiation-method fast-Fourier-transform (FDM-FFT) micromagnetics. The micromagnetic cells in the regular mesh used by the FDM-FFT method are finite-sized elements, but not geometrical points. Therefore, the key PBC operations for FDM-FFT methods are splitting and relocating the micromagnetic cell surfaces to stay symmetrically inside the box of half-total sizes with respect to the origin. The properties of the demagnetizing matrix of the split micromagnetic cells are discussed, and the sum rules of demagnetizing matrix are fulfilled by the symmetric PBC.
Received: 29 November 2016      Published: 01 April 2017
PACS:  75.78.Cd (Micromagnetic simulations ?)  
Fund: Supported by the National Natural Science Foundation of China under Grant Nos 51171086 and 51371101.
Cite this article:   
Wentao LU, Chao DAI, Huaicheng GUO et al  2017 Chin. Phys. Lett. 34 047501
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http://cpl.iphy.ac.cn/newweb/10.1088/0256-307X/34/4/047501       OR      http://cpl.iphy.ac.cn/newweb/Y2017/V34/I4/047501
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Wentao LU
Chao DAI
Huaicheng GUO
Jiang-Nan Li
Dan Wei
[1]Brown W F 1963 Micromagnetics (New York: Wiley)
[2]Wei D 2012 Micromagnetics and Recording Materials (Heidelberg: Springer)
[3]Landau L D and Lifshitz E 1960 Electrodynamics of Continuous Media (Oxford: Pergamon Press)
[4]Bertram H N and Zhu J G 1988 J. Appl. Phys. 63 3248
[5]Wang S M, Wei D and Gao K Z 2011 IEEE Trans. Magn. 47 3813
[6]Newell A J and Dunlop D J 1993 J. Geophys. Res. 98 9533
[7]Fukushima H, Nakatani Y and Hayashi N 1998 IEEE Trans. Magn. 34 193
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