| CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Effect of Zr Content on Formation and Optical Properties of the Layered PbZr$_{x}$Ti$_{1-x}$O$_{3}$ Films |
| Yang-Yang Xu1,2, Yu Wang1,2, Ai-Yun Liu1, Wang-Zhou Shi1, Gu-Jin Hu1**, Shi-Min Li2, Hui-Yong Deng2, Ning Dai2** |
1Department of Physics, College of Mathematics and Science, Shanghai Normal University, Shanghai 200234
2National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083
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| Cite this article: |
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Yang-Yang Xu, Yu Wang, Ai-Yun Liu et al 2020 Chin. Phys. Lett. 37 026801 |
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Abstract PbZr$_{x}$Ti$_{1-x}$O$_{3}$ (PZT) films are fabricated on F-doped tin oxide (FTO) substrates using chemical solutions containing PVP polymer and rapid thermal annealing processing. The dependence of the layered PZT multilayer formation and their optical properties on the Zr content $x$ are examined. It is found that all the PZT films are crystallized and exhibit 110-preferred orientation. When $x$ varies in the region of 0–0.8, the PZT films display lamellar structures, and a high reflection band occurs in each optical reflectance spectrum curve. Especially, those PZT films with Zr/Ti atomic ratio of 35/65–65/35 show clearly layered cross-sectional morphologies arranged alternatively by porous and dense PZT layers, and have a peak optical reflectivity of $>$70% and a band width of $>$45 nm. To obtain the optimal Bragg reflection performance of the PZT multilayers, the Zr content should be selected in the range of 0.35–0.65.
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Received: 04 November 2019
Published: 18 January 2020
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| PACS: |
68.55.-a
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(Thin film structure and morphology)
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68.37.-d
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(Microscopy of surfaces, interfaces, and thin films)
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78.66.-w
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(Optical properties of specific thin films)
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81.05.-t
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(Specific materials: fabrication, treatment, testing, and analysis)
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77.55.hj
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(PZT)
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| Fund: Supported by the Frontier Science Research Project of Chinese Academy of Sciences (No. QYZDJ-SSW-SLH018), the National Natural Science Foundation of China (Nos. 11174307 and 11933006), and the National Key Basic Research Program of China (No. 2016YFB0402405). |
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| [1] | Li B, Zhou J, Li L, Wang X J, Liu X H and Zi J 2003 Appl. Phys. Lett. 83 4704 | | [2] | Jim K L, Wang D Y, Leung C W, Choy C L and Chan H L 2008 J. Appl. Phys. 103 083107 | | [3] | Oh J M, Hoshina T, Takeda H and Tsurumi T 2013 Appl. Phys. Express 6 062001 | | [4] | Hu G J, Chen J, An D L, Chu J H and Dai N 2005 Appl. Phys. Lett. 86 162905 | | [5] | Hong X K, Hu G J, Chen J, Chu J H, Dai N and Wu H Z 2006 Appl. Phys. Lett. 89 082902 | | [6] | Hu G J, Hong X K, Chu J H and Dai N 2007 Appl. Phys. Lett. 90 162904 | | [7] | Hong X K, Hu G J, Shang J L, Bao J, Chu J H and Dai N 2007 Appl. Phys. Lett. 90 251911 | | [8] | Zhang T, Hu G J, Bu H J, Wu J, Chu J H and Dai N 2010 J. Appl. Phys. 107 084103 | | [9] | Shang J L, Hu G J, Zhang T, Sun Y, Wu J, Chu J H and Dai N 2009J. Am. Ceram. Soc. 92 539 | | [10] | Gong S, Wang Y H, Zhao X Y, Zhang M, Zhao N and Duan Y F 2011 Chin. Phys. Lett. 28 087402 | | [11] | Takenaka S and Kozuka H 2001 Appl. Phys. Lett. 79 3485 | | [12] | Macleod H A 1986 Thin-Film Optical Filters 2nd edn (New York: Macmillan Press) p 412 | | [13] | Shirane G, Sawaguchi E and Takagi Y 1951 Phys. Rev. 84 476 | | [14] | Hu C S, Sun X, Luo Z L and Gao C 2014 Chin. Phys. Lett. 31 110501 |
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