Chin. Phys. Lett.  2017, Vol. 34 Issue (1): 016104    DOI: 10.1088/0256-307X/34/1/016104
Ion-Beam-Induced Luminescence of LiF Using Negative Ions
Meng-Lin Qiu1, Ying-Jie Chu1, Guang-Fu Wang1,2**, Mi Xu1, Li Zheng1
1College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875
2Beijing Radiation Center, Beijing 100875
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Meng-Lin Qiu, Ying-Jie Chu, Guang-Fu Wang et al  2017 Chin. Phys. Lett. 34 016104
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Abstract Negative ion-beam-induced luminescence (IBIL) measurements of a pure LiF crystal using 20 keV H$^{-}$ are performed to monitor the formation and annihilation of luminescence centers during ion irradiation. Several emission bands are observed in the IBIL spectra and the evolvement mechanisms of the corresponding centers are identified. The difference between the IBIL measurements using positive ions and negative ions is that the intensities of luminescence centers can reach the maxima at lower fluences under negative-ion irradiation due to free charge accumulation.
Received: 31 August 2016      Published: 29 December 2016
PACS:  61.80.Jh (Ion radiation effects)  
  41.75.Cn (Negative-ion beams)  
  61.72.J- (Point defects and defect clusters)  
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Meng-Lin Qiu
Ying-Jie Chu
Guang-Fu Wang
Mi Xu
Li Zheng
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