| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Ultrafast Imaging of Electronic Relaxation in Ortho-xylene: New Features from Fragmentation-Ion Spectroscopy |
| LIU Yu-Zhu1**, KNOPP Gregor2, XIAO Shao-Rong1, GERBER Thomas2 |
1College of Physics and Opto-electronics Engineering, Nanjing University of Information Science & Technology, Nanjing 210044
2Paul Scherrer Institute, Villigen 5232, Switzerland
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| Cite this article: |
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LIU Yu-Zhu, KNOPP Gregor, XIAO Shao-Rong et al 2014 Chin. Phys. Lett. 31 127802 |
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Abstract As a continuous work of tracking electronic relaxation of the S2 state in o-xylene by photoelectron imaging [Y. Liu et al., Phys. Chem. Chem. Phys. 15 (2013) 18101], we report another contribution from the view of fragment-ion spectroscopy. Three components with time constants of τ1?60 fs, τ2=55(±20) fs and τ3=6.99(±0.25) ps are observed for the only fragment-ion C6H4CH3+. The velocity map image of the fragment-ion against the delay time are also measured. Transient information about the kinetic energy of the fragment-ion and angular distribution are analyzed and discussed. New features for competing ultrafast internal conversion and intersystem crossing are obtained.
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Published: 12 January 2015
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| PACS: |
78.47.J-
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(Ultrafast spectroscopy (<1 psec))
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32.80.Fb
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(Photoionization of atoms and ions)
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33.20.-t
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(Molecular spectra)
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