| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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An Alternating-Current Voltage Modulated Thermal Probe Technique for Local Seebeck Coefficient Characterization |
| XU Kun-Qi1,2, ZENG Hua-Rong1**, YU Hui-Zhu1,2, ZHAO Kun-Yu1, LI Guo-Rong1, SONG Jun-Qiang3, SHI Xun3, CHEN Li-Dong3 |
1Key Laboratory of Inorganic Functional Materials and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050
2University of Chinese Academy of Sciences, Beijing 100039
3State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050
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| Cite this article: |
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XU Kun-Qi, ZENG Hua-Rong, YU Hui-Zhu et al 2014 Chin. Phys. Lett. 31 127201 |
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Abstract An ac voltage-modulated thermal probe technique based on the atomic force microscope is developed to measure local Seebeck coefficients (S) of thermoelectric bulk and films. The characterization principle is based on the strictly quadratic relationship between the excited local dc Seebeck voltage and the applied ac voltage at high frequency. Excellent agreement is found between local S values and their corresponding macro-S values of thermoelectric bulk and thin films. This thermoelectric probe technique provides a very convenient, promising tool for local thermoelectric parameters with sub-micrometer scale resolution.
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Published: 12 January 2015
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| PACS: |
72.20.Pa
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(Thermoelectric and thermomagnetic effects)
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73.50.Lw
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(Thermoelectric effects)
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68.37.Ps
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(Atomic force microscopy (AFM))
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