Chin. Phys. Lett.  2013, Vol. 30 Issue (2): 028502    DOI: 10.1088/0256-307X/30/2/028502
CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
An Analytical Model of SiGe Heterojunction Bipolar Transistors on SOI Substrate for Large Current Situations
XU Xiao-Bo1**, ZHANG Bin2, YANG Yin-Tang2, LI Yue-Jin2
1School of Electronic and Control Engineering, Road Traffic Detection and Equipment Engineering Research Center, Chang'an University, Xi'an 710064
2Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071
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XU Xiao-Bo, ZHANG Bin, YANG Yin-Tang et al  2013 Chin. Phys. Lett. 30 028502
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Abstract The large current effect of silicon germanium heterojunction bipolar transistors fabricated on thin silicon-on-insulator is included in the model. As the current is two-dimensional, the injection for large current is vertical plus horizontal and is quite different from that of the bulk device. Critical parameters modeling the large current, such as the collector injection width, the hole density and the corresponding potential in the injection region, are discussed, and the influence to the transit time is also analyzed.
Received: 25 April 2012      Published: 02 March 2013
PACS:  85.30.Pq (Bipolar transistors)  
  85.30.De (Semiconductor-device characterization, design, and modeling)  
  85.30.-z (Semiconductor devices)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/30/2/028502       OR      https://cpl.iphy.ac.cn/Y2013/V30/I2/028502
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XU Xiao-Bo
ZHANG Bin
YANG Yin-Tang
LI Yue-Jin
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