| CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
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Sub-Wavelength Near-Field Metal Detection using an On-Chip Spintronic Technique |
| WANG Qi1,2, ZHU Xiao-Feng2, YUAN Xiao-Wen1, CHEN Chang-Qing1, LUO Xiang-Dong2**, ZHANG Bo2** |
1Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074
2National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083
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| Cite this article: |
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WANG Qi, ZHU Xiao-Feng, YUAN Xiao-Wen et al 2013 Chin. Phys. Lett. 30 128501 |
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Abstract A spintronic near-field microwave imaging system without vector network analyzers is used to detect the distribution of microwaves, which are scattered by a sub-wavelength periodical metal wire grating. An ultra thin metal body with diameter of 100 μm (λ/300) is observed by imaging illuminated by a 10 GHz shining source. An application with high sensitivity and resolution detection is proposed in the microwave region under a weak applied external static magnetic field.
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Received: 25 July 2013
Published: 13 December 2013
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| PACS: |
85.75.-d
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(Magnetoelectronics; spintronics: devices exploiting spin polarized transport or integrated magnetic fields)
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07.57.Kp
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(Bolometers; infrared, submillimeter wave, microwave, and radiowave receivers and detectors)
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07.60.Ly
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(Interferometers)
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84.40.-x
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(Radiowave and microwave (including millimeter wave) technology)
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Abstract
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