| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Refractive Index Profiles of Copper Ion Exchange Glass Planar Waveguides |
| XIA Hong-Yun, TENG Chuan-Xin, ZHAO Xiao-Wei, ZHENG Jie** |
| State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012 |
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Abstract Glass planar optical waveguides are fabricated by the copper ion-exchange technique. The refractive index (RI) profiles of waveguides are reconstructed by the inverse Wentzel–Kramers–Brillouin (IWKB) method. Cu+ and Cu2+ ion concentrations are calculated by solving the diffusion equation, and the mechanism of RI changes is analyzed. The model between the RI and ion concentrations is proposed by taking both Cu+ and Cu2+ into account, according to polarizability changes among Cu+, Cu2+ and Na+. The results show that the contribution of Cu2+ is not negligible, and the reason for the RI change is of Cu+ and Cu2+. With the exchange time increasing, the redox process between Cu+ and Cu2+ will play an important role on RI profiles.
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Received: 05 March 2012
Published: 31 July 2012
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| PACS: |
42.82.Et
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(Waveguides, couplers, and arrays)
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42.70.Ce
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(Glasses, quartz)
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42.55.Rz
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(Doped-insulator lasers and other solid state lasers)
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