Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy

doi:10.1088/0256-307X/28/9/097803

Chin. Phys. Lett.

2011, Vol. 28

Issue (9): 097803 DOI: 10.1088/0256-307X/28/9/097803

CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES

Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy

MA Feng-Ying, SU Jian-Po^**, GONG Qiao-Xia, YANG Jing, DU Yan-Li, GUO Mao-Tian, YUAN Bin

School of Physical Science and Engineering, Zhengzhou University, Zhengzhou 450001

Cite this article:

MA Feng-Ying, SU Jian-Po, GONG Qiao-Xia et al 2011 Chin. Phys. Lett. 28 097803

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Abstract Three kinds of nanometer-scale metal films (Cr, Ni and Ti) with different thicknesses are fabricated. The complex refractive indices of the three metal films are quantitatively measured by using THz differential time-domain spectroscopy (THz-DTDS). The orders of the complex refractive indices of the thin metal films are equal to those of the reported values. Our results validated that THz-DTDS can be used to study the features of the ultra-thin metal films.

Keywords: 78.20.Ci 78.66.Bz 07.57.Pt

Received: 17 February 2011 Published: 30 August 2011

PACS:	78.20.Ci	(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
	78.66.Bz	(Metals and metallic alloys)
	07.57.Pt	(Submillimeter wave, microwave and radiowave spectrometers; magnetic resonance spectrometers, auxiliary equipment, and techniques)

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https://cpl.iphy.ac.cn/10.1088/0256-307X/28/9/097803 OR https://cpl.iphy.ac.cn/Y2011/V28/I9/097803

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	MA Feng-Ying
	SU Jian-Po
	GONG Qiao-Xia
	YANG Jing
	DU Yan-Li
	GUO Mao-Tian
	YUAN Bin

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