Chin. Phys. Lett.  2011, Vol. 28 Issue (8): 087301    DOI: 10.1088/0256-307X/28/8/087301
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Leakage Current and Photovoltaic Properties in a Bi2Fe4O9/Si Heterostructure
JIN Ke-Xin**, LUO Bing-Cheng, ZHAO Sheng-Gui, WANG Jian-Yuan, CHEN Chang-Le
Shaanxi Key Laboratory of Condensed Matter Structures and Properties, School of Science, Northwestern Polytechnical University, Xi'an 710072
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JIN Ke-Xin, LUO Bing-Cheng, ZHAO Sheng-Gui et al  2011 Chin. Phys. Lett. 28 087301
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Abstract A heterostructure composed of a Bi2Fe4O9 film and an n−type Si substrate is fabricated. The characteristics of leakage current density versus electric field are investigated and the leakage current density is about 6×10−6 A/cm2 at an electric field of 200 kV/cm at 300 K. A strong photovoltaic effect is observed when the heterostructure is exposed to a laser pulse with a wavelength of 532 nm and a power of 6 mW/mm2. It is found that the peak photovoltages initially increase with decreasing temperature, followed by a decrease at T<210 K. These results reveal that the heterostructure is a promising candidate for photovoltaic devices that are compatible with Si integrated circuits.
Keywords: 73.40.Lq      73.50.Pz      77.55.Nv     
Received: 09 April 2011      Published: 28 July 2011
PACS:  73.40.Lq (Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)  
  73.50.Pz (Photoconduction and photovoltaic effects)  
  77.55.Nv (Multiferroic/magnetoelectric films)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/28/8/087301       OR      https://cpl.iphy.ac.cn/Y2011/V28/I8/087301
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JIN Ke-Xin
LUO Bing-Cheng
ZHAO Sheng-Gui
WANG Jian-Yuan
CHEN Chang-Le
[1] Yang C H, Seidel J, Kim S Y, Rossen P B, Yu P, Gajek M, Chu Y H, Martin L W, Holcomb M B, He Q, Maksymovych P, Balke N, Kalinin S V, Baddorf A P, Basu S R, Scullin M L and Ramesh R 2009 Nature Mater. 8 485
[2] Liu J M, Chan-Wong L W and Choy C L 2009 Chin. Phys. Lett. 26 087501
[3] Fiebig M 2005 J. Phys. D: Appl. Phys. 38 R123
[4] Zhou C C et al 2010 Solid State Commun. 150 1334
[5] Baettig P, Ederer C and Spaldin N A 2005 Phys. Rev. B 72 214105
[6] Wang J et al 2009 Chin. Phys. Lett. 26 117301
[7] Wang J, Neaton J B, Zheng H, Nagarajan V, Ogale S B, Liu B, Viehland D, Vaithyanathan V, Schlom D G, Waghmare U V, Spaldin N A, Rabe K M, Wuttig M and Ramesh R 2003 Science 299 1719
[8] Poghossian A S, Abovian H V, Avakian P B, Mkrtchian S H and Haroutunian V M 1991 Sensors Actuators B 4 545
[9] Yang Z, Huang Y, Dong B, Li H L and Shi S Q 2006 J. Solid State Chem. 179 3324
[10] Zakharchenko N I 2000 Russ. J. Appl. Chem. 73 2047
[11] Xiong Y, Wu M, Peng Z, Jiang N and Chen Q 2004 Chem. Lett. 33 502
[12] Koizumi H, Niizeki N and Ikeda T 1964 Jpn. J. Appl. Phys. 3 495
[13] Bokov V A, Novikov G V, Trukhtanov V A and Yushchuk S I 1970 Sov. Phys. Solid State 11 2324
[14] Shamir N and Gurewitz E 1978 Acta Crystallogr. Sect. A 34 662
[15] Singh A K, Kaushik S D, Kumar B, Mishra P K, Venimadhav A, Siruguri V and Patnaik S 2008 Appl. Phys. Lett. 92 132910
[16] Tian Z M, Yuan S L, Wang X L, Zheng X F, Yin S Y, Wang C H and Liu L 2009 J. Appl. Phys. 106 103912
[17] Ressouche E, Simonet V, Canals B, Gospodinov M and Skumryev V 2009 Phys. Rev. Lett. 103 267204
[18] Park Y A, Song K M, Lee K D, Won C J and Hur N 2010 Appl. Phys. Lett. 96 092506
[19] Fu Z X et al 1999 Chin. Phys. Lett. 16 753
[20] Ma J J et al 2010 Chin. Phys. Lett. 27 107304
[21] Jin K X, Zhao S G, Chen C L, Tan X Y and Jia X W 2009 J. Phys. D: Appl. Phys. 42 015001
[22] Worledge D C, Mieville L and Geballe T H 1998 J. Appl. Phys. 83 5913
[23] Selbach S M, Tybell T, Einarsrud M A and Grande T 2007 Chem. Mater 19 6478
[24] Yang H, Jain M, Suvorova N A, Zhou H, Luo H M, Feldmann D M, Dowden P C, DePaula R F, Foltyn S R and Jia Q X 2007 Appl. Phys. Lett. 91 072911
[25] Yang H, Wang H, Zou G F, Jain M, Suvorova N A and Feldmann D M 2008 Appl. Phys. Lett. 93 142904
[26] Lampert M A and Mark P 1970 Current Injection in Solids (New York: Academy) p 4
[27] Pabst Gary W, Martin Lane W et al 2007 Appl. Phys. Lett. 90 072902
[28] Ji W et al 2010 Adv. Mater. 22 1763
[29] Choi T, Lee S, Choi Y J, Kiryukhin V and Cheong S W 2009 Science 324 63
[30] Sun J R, Shen B G, Sheng Z G and Sun Y P 2004 Appl. Phys. Lett. 85 3375
[31] Jin K X, Zhao S G, Tan X Y and Chen C L 2008 Mater. Lett. 62 4452
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