| ATOMIC AND MOLECULAR PHYSICS |
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Potential and Kinetic Electron Emissions from HOPG Surface Irradiated by Highly Charged Xenon and Neon Ions |
| WANG Yu-Yu1,2**, ZHAO Yong-Tao1, SUN Jian-Rong1, LI De-Hui1, QAYYUM Abdul 3 , LI Jin-Yu1, WANG Ping-Zhi1, XIAO Guo-Qing1
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1Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000
2Graduate University of the Chinese Academy of Sciences, Beijing 100049
3Physics Division, Pakistan Institute of Nuclear Science and Technology, P.O. Nilore, Islamabad, Pakistan
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| Cite this article: |
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WANG Yu-Yu, ZHAO Yong-Tao, SUN Jian-Rong et al 2011 Chin. Phys. Lett. 28 053402 |
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Abstract Highly charged 129Xeq+ (q=10–30) and 40Neq+ (q=4–8) ion−induced secondary electron emissions on the surface of highly oriented pyrolytic graphite (HOPG) are reported. The total secondary electron yield is measured as a function of the potential energy of incident ions. The experimental data are used to separate contributions of kinetic and potential electron yields. Our results show that about 4.5% and 13.2% of ion's potential energies are consumed in potential electron emission due to different Xeq+−HOPG and Neq+-HOPG combinations. A simple formula is introduced to estimate the fraction of ion's potential energy for potential electron emission.
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| Keywords:
34.50.Dy
79.20.Rf
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Received: 01 September 2010
Published: 26 April 2011
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| PACS: |
34.50.Dy
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79.20.Rf
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(Atomic, molecular, and ion beam impact and interactions with surfaces)
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