| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Multilayer Antireflection Coating for Triple Junction Solar Cells |
| ZHAN Feng**, WANG Hai-Li, HE Ji-Fang, WANG Juan, HUANG She-Song, NI Hai-Qiao, NIU Zhi-Chuan
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State Key Lab for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083
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| Cite this article: |
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ZHAN Feng, WANG Hai-Li, HE Ji-Fang et al 2011 Chin. Phys. Lett. 28 047802 |
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Abstract According to the theory of optical films, we simulate the reflectivity of antireflection coatings (ARCs) for solar cells of Ga0.5In0.5P/GaAs/Ge based on an optical transfer matrix. In order to provide sufficient consideration of the refractive index dispersion effect of multilayer ARCs, we use multi−dimensional matrix data for reliable simulation. After the reflection curves are obtained, the effective average reflectance Re is introduced to optimize the film system by minimizing Re. Optimization of single layer (Al2O3), double layer (MgF2/ZnS) and triple layer (MgF2/Al2O3/ZnS) ARCs is realized by using this method for space and terrestrial applications. Effects of these ARCs are compared after optimization. These theoretical parameters can be used to guide experiments.
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| Keywords:
78.20.-e
78.20.Ci
78.30.Fs
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Received: 05 January 2011
Published: 29 March 2011
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| PACS: |
78.20.-e
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(Optical properties of bulk materials and thin films)
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78.20.Ci
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(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
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78.30.Fs
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(III-V and II-VI semiconductors)
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