Chin. Phys. Lett.  2011, Vol. 28 Issue (10): 107802    DOI: 10.1088/0256-307X/28/10/107802
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Structural and Magnetic Properties of Ni-Implanted Rutile Single Crystals
DING Bin-Feng**, LI Yong-Ping, WANG Li-Ming
Department of Physics and Electronic Information, Langfang Teachers College, Langfang 065000
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DING Bin-Feng, LI Yong-Ping, WANG Li-Ming 2011 Chin. Phys. Lett. 28 107802
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Abstract The structural and magnetic properties of Ni-implanted rutile single crystals are discussed. Ni nanocrystals (NCs) are formed in TiO2 after ion implantation. Their crystalline sizes increase with increasing post−annealing temperature. Metallic Ni nanocrystals inside the TiO2 matrix are stable up to an annealing temperature of 1073 K. The Ni NCs formed inside TiO2 are the major contribution to the measured ferromagnetism.
Keywords: 78.67.Bf      61.05.Cp      82.80.Yc     
Received: 02 June 2011      Published: 28 September 2011
PACS:  78.67.Bf (Nanocrystals, nanoparticles, and nanoclusters)  
  61.05.cp (X-ray diffraction)  
  82.80.Yc (Rutherford backscattering (RBS), and other methods ofchemical analysis)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/28/10/107802       OR      https://cpl.iphy.ac.cn/Y2011/V28/I10/107802
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DING Bin-Feng
LI Yong-Ping
WANG Li-Ming
[1] Nefedov A, Akdogan N, Zabel H, Khaibulin R I and Tagirov L R 2006 Appl. Phys. Lett. 89 182509
[2] Jung S W, An S J, Yi G C, Jung C U, Lee S I and Cho S 2002 Appl. Phys. Lett. 80 4561
[3] Polyakov A Y, Govorkov A V, Smirnov N B, Pashkova N V, Pearton S J, Ip K, Frazier R M, Abernathy C R, Norton D P, Zavada J M and Wilson R G 2004 Mater. Sci. Semicond. Process. 7 77
[4] Zhou S Q, Potzger K, Zhang G F, Eichhorn F, Skorupa W, Helm M and Fassbender J 2006 J. Appl. Phys. 100 114304
[5] Pinto J V, Cruz M M, da Silva R C, Franco N, Casaca A, Alves E and Godinho M 2007 Eur. Phys. J. B 55 253
[6] Chambers S A, Droubay T, Wang C M, Lea A S, Farrow R C F, Folks L, Deline V and Anders S 2003 Appl. Phys. Lett. 82 1257
[7] Kim Y J, Thevuthasan S, Droubay T, Lea A S, Wang C M, Shut thanandan V, Chambers S A, Sears R P, Taylor B and Sinkovic B 2004 Appl. Phys. Lett. 84 3531
[8] Zhu S, Wang L M, Zu X T and Xiang X 2006 Appl. Phys. Lett. 88 043107
[9] Xin Y, Lu J, Stampe P A and Kennedy R J 2006 Appl. Phys. Lett. 88 112512
[10] Silva C, Cruz M M, da Silva R C, Alves L C and Godinho M 2010 J. Phys. Conf. Ser. 200 062028
[11] Hong N H, Sakai J, Poirot N and Brizé V 2006 Phys. Rev. B 73 132404
[12] Zhou S, Cizmar E, Potzger K, Krause M, Talut G, Helm M, Fassbender J, Zvyagin S A, Wosnitza J and Schmidt H 2009 Phys. Rev. B 79 113201
[13] Cruz M M, da Silva R C, Franco N and Godinho M 2009 J. Phys. Condens. Matter 21 206002
[14] Akdogan N, Nefedov A, Zabel H, Westerholt K, Becker H W, Somsen C, Gok S, Bashir A , Khaibullin R and Tagirov L 2009 J. Phys. D: Appl. Phys. 42 115005
[15] Seshadri R 2005 Curr. Opin. Solid State Mater. Sci. 9 1
[16] Coey J M D and and Chambers S A 2008 MRS Bull. 33 1053
[17] Dietl T 2007 J. Phys. Condens. Matter 19 165204
[18] Shinde S R, Ogale S B, Higgins J S, Zheng H, Millis A J, Kulkarni V N, Ramesh R, Greene R L and Venkatesan T 2004 Phys. Rev. Lett. 92 166601
[19] Zhang S X, Yu W, Ogale S B, Shinde S R, Kundaliya D C, Tse W K, Young S Y, Higgins J S, Salamanca-Riba L G, Herrera M, Fu L F, Browning N D, Greene R L and Venkatesan T 2007 Phys. Rev. B 76 085323
[20] Kucheyev S O, Williams J S, Jagadish C, Zou J, Evans C, Nelson A J and Hamza A V 2003 Phys. Rev. B 67 094115
[21] Chu W K, Mayer J W and Nicolet M A 1978 Backscattering Spectrometry (New York: Academic) p 133
[22] Doolittle L 1985 Nucl. Instrum. Methods Phys. Res. B 9 344
[23] Zhou S Q, Talut G, Potzger K et al 2008 J. Appl. Phys. 103 083907
[24] Edelman I S, Petrakovskaja E A, Petrov D A, Zharkov S M, Khaibullin R I, NuzhdinV I and Stepanov A L 2010 Appl. Magn. Res. 40 363
[25] Abraham D W, Frank M M and Guha S 2005 Appl. Phys. Lett. 87 252502
[26] Belghazi Y, Schmerber G, Colis S, Rehspringer J L and Dinia A 2006 Appl. Phys. Lett. 89 122504
[27] Respaud M, Broto J M, Rakoto H, Fert A R, Thomas L, Barbara B, Verelst M, Snoeck E, Lecante P, Mosset A, Osuna J, Ely T O, Amiends C and Chaudret B 1998 Phys. Rev. B 57 2925
[28] Bean C P and Livingston J D 1959 J. Appl. Phys. 30 S120
[29] Pinto J V, Cruz M M, da Silva R C, Alves E and Godinho M 2005 J. Magn. Magn. Mater. 294 e73
[30] Yu Z, Li X, Long X, Cheng X W, Wang J Y, Liu Y, Cao M S and Wang X F 2008 Acta Phys. Sin. 57 4539 (in Chinese)
[31] Zhou S Q, Potzger K, von Borany J, Grötzschel R, Skorupa W, Helm M and Fassbender J 2008 Phys. Rev. B 77 035209
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