| CONDENSED MATTER: STRUCTURE, MECHANICAL AND THERMAL PROPERTIES |
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Small-Angle X-Ray Scattering Study on Nanostructures of Polyimide Films |
LIU Xiao-Xu1,2, YIN Jing-Hua1,4, SUN Dao-Bin2, BU Wen-Bin1, CHENG Wei-Dong3, WU Zhong-Hua3 |
| 1School of Applied Science, Harbin University of Science and Technology, Harbin 150080 2Heilongjiang Institutes of Science and Technology, Harbin 150027 3Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 4Key Laboratory of Engineering Dielectric and Applications (Ministry of Education), Harbin University of Science and Technology, Harbin 150080 |
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| Cite this article: |
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LIU Xiao-Xu, YIN Jing-Hua, SUN Dao-Bin et al 2010 Chin. Phys. Lett. 27 096103 |
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Abstract Inorganic nanohybrid polyimide (PI) is widely applied in electrical and electronic devices for its outstanding insulating properties. Samples 100CR and 100NH are made in Dupont. Among them, 100NH is a kind of pure PI films; however, 100CR is a kind of inorganic nanohybrid PI films with excellent corona-resistance. The nanostructure of PI films is investigated with small-angle x-ray scattering technique and transmission electron microscopy (TEM). The normalized volume fractions of the scatterers in the specimens are obtained with a tangent-by-tangent data analysis for the small-angle x-ray scattering data. The multi-hierarchical scatterers of 100NH can be divided into two dominant components, i.e., the sharp component and the wide component. The sharp component is corresponding to the contribution of PI molecular chains, and the wide component includes the aggregates formed by PI molecular chains and the film has nested dual-fractal characteristics, nevertheless the 100CR film possesses three types of scale scattering made up of inorganic nanoparticles, molecular chains and aggregates. The present films have multi-fractal structures. The distribution and structure of scattering body of two kinds of PI films are analyzed. The results of SAXS agree well with those of TEM methods.
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| Keywords:
61.10.Eq
61.82.Pv
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Received: 26 May 2010
Published: 25 August 2010
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[1] Lewis T J 2004 IEEE Trans. Dielectrics and Electrical Insulation 11 739
[2] Liu X X, Yin J H, Bu W B, Song Y L and Jia P F 2009 Proc. IEEE Int. Conf. Prop. Appl. Dielectr. Mater. (ICPADM2009) 2 826
[3] Johnston D R and Markovitz M 1988 United States Patent 4760296
[4] Liu Y, Wu Z F and Liu L 2005 Acta Phys. Sin. 54 1679 (in Chinese)
[5] Liu W and Johnson W L 1999 Phys. Rev. B 59 11755
[6] Machado G et al 2009 Eur. Polymer J. 45 700
[7] Mylonas E, Hascher A, Bernad P, Blackledge M and Mandelkow E 2008 Biochemistry 39 10345
[8] Meng Z F 1996 Theory and Applicaion of Small Angle X-ray Scattering (Changchun: Jilin Science and Technical Press) p 73 (in Chinese)
[9] Roess L C and Shull C G 1947 J. Appl. Phys. 18 308
[10] Jellinek M H, Solomon H and Fankuchen I 1946 Ind. Eng. Chem. Anal. Ed. 18 172
[11] Svergun D I 1991 J. Appl. Cryst. 24 485
[12] Vonk C G 1976 J. Appl. Cryst. 9 433
[13] Glatter O 1979 J. Appl. Cryst. 12 166
[14] Riseman J 1952 Acta. Cryst. 5 193
[15] Wang W, Chen X, Cai Q, Mo G, Jiang L S and Zhang K H 2008 Eur. Phys. J. B 65 57
[16] Shao Y Z, Zhong W R, Ren S, Cai Z S and Lei G 2005 Acta. Phys. Sin. 54 3290 (in Chinese)
[17] Porod G and Kolloid Z Z 1951 Polymers 124 83
[18] Xu Y, Wu D, Sun Y H, Li Z H, Dong B Z and Wu Z H 2005 Acta. Phys. Sin. 54 2814 (in Chinese)
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